Fabrication of Sudan III thin film for sensor technology application has been carried out by using PVD method. The physical structure i.e crystallinity of this film have been investigated by using XRD method. In this paper would be described the interplanar distance of crystals plane, the average crystallite size and the average molecular chain separation within the Sudan III thin film and also for pure Sudan III in powder form as comparison. The optical properties of the Sudan III thin film is also discussed.
